TrustMAE: A Noise-Resilient Defect Classification Framework using Memory-Augmented Auto-Encoders with Trust Regions
AI-generated Key Points
- TrustMAE is a framework for product defect classification
- TrustMAE can accept datasets with unlabeled images, unlike other methods
- It is robust against noises or defective images in the training dataset
- Utilizes a memory-augmented auto-encoder with a sparse memory addressing scheme
- Incorporates a trust-region memory updating scheme to prevent noise in memory slots
- Can reconstruct defect-free images and identify defective regions using a perceptual distance network
- Performs competitively on noise-free MVTec datasets and outperforms other baselines at up to 40% noise level
- Achieves the best AUC score on most classes and overall mean AUC compared to other works on defect detection
- Lower performance in certain classes due to difficulties in modeling large variations in normal data caused by rotations or randomly appearing prints
- Does not include a warping module but compares favorably to recent works in defect segmentation using pixel-level AUC evaluation
Authors: Daniel Stanley Tan, Yi-Chun Chen, Trista Pei-Chun Chen, Wei-Chao Chen
Abstract: In this paper, we propose a framework called TrustMAE to address the problem of product defect classification. Instead of relying on defective images that are difficult to collect and laborious to label, our framework can accept datasets with unlabeled images. Moreover, unlike most anomaly detection methods, our approach is robust against noises, or defective images, in the training dataset. Our framework uses a memory-augmented auto-encoder with a sparse memory addressing scheme to avoid over-generalizing the auto-encoder, and a novel trust-region memory updating scheme to keep the noises away from the memory slots. The result is a framework that can reconstruct defect-free images and identify the defective regions using a perceptual distance network. When compared against various state-of-the-art baselines, our approach performs competitively under noise-free MVTec datasets. More importantly, it remains effective at a noise level up to 40% while significantly outperforming other baselines.
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