Dynamical analysis of the buildup process near resonance
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- Villavicencio and Romo investigate the time evolution of the buildup process inside a double-barrier system for off-resonance incidence energies
- They consider the analytic solution of the time-dependent Schrödinger equation with cutoff plane wave initial conditions to study this phenomenon
- The buildup process exhibits invariances under arbitrary changes on the system parameters, which can be successfully described by a simple and easy-to-use one-level formula
- The buildup of off-resonant probability density is characterized by an oscillatory pattern modulated by the resonant case, which governs the duration of the transient regime
- Off-resonant and resonant tunneling are two correlated processes whose transient regime is characterized by the same transient time constant of two lifetimes
- This study provides valuable insights into how double-barrier systems behave under different conditions, shedding light on important phenomena such as tunneling and quantum mechanics
- The authors' findings could have implications for a range of fields including materials science, electronics, and quantum computing.
Authors: Jorge Villavicencio (Centro de Investigacion Cientifica y de Educacion Superior de Ensenada, Ensenada Baja California, Mexico), Roberto Romo (Facultad de Ciencias, Universida Autonoma de Baja California, Ensenada, Baja California, Mexico)
Abstract: The time evolution of the buildup process inside a double-barrier system for off-resonance incidence energies is studied by considering the analytic solution of the time dependent Schr\"{o}dinger equation with cutoff plane wave initial conditions. We show that the buildup process exhibits invariances under arbitrary changes on the system parameters, which can be successfully described by a simple and easy-to-use one-level formula. We find that the buildup of the off-resonant probability density is characterized by an oscillatory pattern modulated by the resonant case which governs the duration of the transient regime. This is evidence that off-resonant and resonant tunneling are two correlated processes, whose transient regime is characterized by the same transient time constant of two lifetimes.
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