@misc{davoudi2017temperature,
  title={Temperature Dependence of the Yield Strength of Aluminum Thin Films: Multiscale Modeling Approach},
  author={Kamyar Davoudi},
  year={2017},
  eprint={1701.07595},
  archivePrefix={arXiv},
  primaryClass={cond-mat.mtrl-sci},
  doi={10.1016/j.scriptamat.2016.12.039},
  url={https://arxiv.org/abs/1701.07595}
}