@misc{tan2020trustmae,
  title={TrustMAE: A Noise-Resilient Defect Classification Framework using Memory-Augmented Auto-Encoders with Trust Regions},
  author={Daniel Stanley Tan and Yi-Chun Chen and Trista Pei-Chun Chen and Wei-Chao Chen},
  year={2020},
  eprint={2012.14629},
  archivePrefix={arXiv},
  primaryClass={cs.CV},
  url={https://arxiv.org/abs/2012.14629}
}