EDALearn: A Comprehensive RTL-to-Signoff EDA Benchmark for Democratized and Reproducible ML for EDA Research

Authors: Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Yiran Chen

8 pages

Abstract: The application of Machine Learning (ML) in Electronic Design Automation (EDA) for Very Large-Scale Integration (VLSI) design has garnered significant research attention. Despite the requirement for extensive datasets to build effective ML models, most studies are limited to smaller, internally generated datasets due to the lack of comprehensive public resources. In response, we introduce EDALearn, the first holistic, open-source benchmark suite specifically for ML tasks in EDA. This benchmark suite presents an end-to-end flow from synthesis to physical implementation, enriching data collection across various stages. It fosters reproducibility and promotes research into ML transferability across different technology nodes. Accommodating a wide range of VLSI design instances and sizes, our benchmark aptly represents the complexity of contemporary VLSI designs. Additionally, we provide an in-depth data analysis, enabling users to fully comprehend the attributes and distribution of our data, which is essential for creating efficient ML models. Our contributions aim to encourage further advances in the ML-EDA domain.

Submitted to arXiv on 04 Dec. 2023

Explore the paper tree

Click on the tree nodes to be redirected to a given paper and access their summaries and virtual assistant

Also access our AI generated Summaries, or ask questions about this paper to our AI assistant.

Look for similar papers (in beta version)

By clicking on the button above, our algorithm will scan all papers in our database to find the closest based on the contents of the full papers and not just on metadata. Please note that it only works for papers that we have generated summaries for and you can rerun it from time to time to get a more accurate result while our database grows.