@misc{hyun2023reconpatch,
  title={ReConPatch : Contrastive Patch Representation Learning for Industrial Anomaly Detection},
  author={Jeeho Hyun and Sangyun Kim and Giyoung Jeon and Seung Hwan Kim and Kyunghoon Bae and Byung Jun Kang},
  year={2023},
  eprint={2305.16713},
  archivePrefix={arXiv},
  primaryClass={cs.CV},
  url={https://arxiv.org/abs/2305.16713}
}