Temperature Dependence of the Yield Strength of Aluminum Thin Films: Multiscale Modeling Approach
Authors: Kamyar Davoudi
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- Study investigates impact of temperature on yield strength of aluminum thin films
- Utilized discrete dislocation dynamics (DDD) simulations for comprehensive analysis
- Considered variations in DDD parameters with temperature
- Referenced existing experimental data using molecular dynamics and three-dimensional simulations
- Found 18% decrease in yield strength from 100 K to 600 K
- Emphasizes importance of considering varying DDD parameters for understanding deformation mechanisms at elevated temperatures
Abstract: Modeling deformation at elevated temperatures using discrete dislocation dynamics (DDD) is a recent area of high interest. However, the literature dedicated to this subject fails to address the variations of DDD parameters with temperature. This study aims to investigate the effect of temperature on the yield strength of aluminum thin films in two-dimensional DDD simulations. To this end, the temperature dependence of DDD parameters has been studied using molecular dynamics, three-dimensional DDD simulations, and the existing experimental results. Based on these calculations, we observed 18% decrease in the yield strength when temperature was increased from 100 K to 600 K.
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