DefectFill: Realistic Defect Generation with Inpainting Diffusion Model for Visual Inspection
Authors: Jaewoo Song, Daemin Park, Kanghyun Baek, Sangyub Lee, Jooyoung Choi, Eunji Kim, Sungroh Yoon
Abstract: Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.
Explore the paper tree
Click on the tree nodes to be redirected to a given paper and access their summaries and virtual assistant
Look for similar papers (in beta version)
By clicking on the button above, our algorithm compares the title and abstract of this paper with all the papers of the same arXiv category that we have summarized, and finds the closest ones. You can rerun it from time to time: the results improve as our database grows.