DefectFill: Realistic Defect Generation with Inpainting Diffusion Model for Visual Inspection

AI-generated keywords: Visual Inspection Defect Data Image Generation Models DefectFill MVTec AD Dataset

AI-generated Key Points

The license of the paper does not allow us to build upon its content and the key points are generated using the paper metadata rather than the full article.

  • Limited availability of defect data hinders the development of effective visual inspection models
  • Previous approaches have used image generation models to create synthetic defect images, but realism has been a challenge
  • Introducing a novel method for generating realistic defects using a small number of reference images
  • Leveraging an inpainting diffusion model with custom loss functions to capture intricate and localized defect features
  • Including a Low-Fidelity Selection technique to enhance the quality of generated defect samples
  • Experimental results demonstrate high-quality defect images and state-of-the-art performance in visual inspection models
  • Potential to significantly improve accuracy and reliability in various industrial applications
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Authors: Jaewoo Song, Daemin Park, Kanghyun Baek, Sangyub Lee, Jooyoung Choi, Eunji Kim, Sungroh Yoon

Accepted by CVPR 2025

Abstract: Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

Submitted to arXiv on 18 Mar. 2025

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Results of the summarizing process for the arXiv paper: 2503.13985v1

This paper's license doesn't allow us to build upon its content and the summarizing process is here made with the paper's metadata rather than the article.

In the field of visual inspection, the development of effective models is hindered by the limited availability of defect data. Previous approaches have utilized image generation models to create synthetic defect images, but achieving a high level of realism in these defects has proven challenging. To address this issue, we introduce , a novel method for generating realistic defects using just a small number of reference images. Our approach leverages a finely-tuned inpainting diffusion model optimized with custom loss functions that incorporate defect, object, and attention terms. This allows for precise capture of intricate and localized defect features while seamlessly integrating them into defect-free objects. Additionally, our method includes a Low-Fidelity Selection technique that further enhances the quality of generated defect samples. Experimental results on the demonstrate that produces high-quality defect images and achieves state-of-the-art performance in visual inspection models. This advancement not only showcases the effectiveness of our approach but also highlights its potential to significantly improve accuracy and reliability in various industrial applications.
Created on 24 Feb. 2026

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