Results of the summarizing process for the arXiv paper: 2303.08425v1

Scientific CMOS (sCMOS) sensors have been developed in recent years and have outperformed CCDs in several aspects, including higher readout frame rate, radiation tolerance, and working temperature. However, image lag can occur when the charges of an event are not fully transferred inside pixels, degrading image quality for optical imaging and energy resolution for X-ray spectroscopy. In this study, a new method was constructed to extract image lag from X-ray photons to measure the influence of image lag on X-ray performance using a customized X-ray sCMOS sensor GSENSE1516BSI. The results showed that the image lag of this sensor exists only in the immediately subsequent frame and is always less than 0.05% for different incident photon energies and under different experimental conditions. The residual charge was smaller than 0.5 e- with the highest incident photon charge around 8 ke-. Compared to the readout noise level around 3 e-, the image lag of this sensor was too small to have a significant impact on imaging quality or energy resolution. The image lag showed a positive correlation with incident photon energy and a negative correlation with temperature but had no dependence on gain setting or integration time. To conduct experiments, an X-ray tube was operated under a current of 0.12 mA and high-voltage of 30kV, allowing X-rays close to 30 keV to be seen in the final spectrum. However, at this high energy, the quantum efficiency of the sensor was low [25,26], capturing only a small number of incident photons by the sensor. Characteristic lines of Ti as well as Cr, Fe and Ni were found in the spectrum coming from stainless steel surrounding structures of the device. A series of experiments were carried out with different gain settings and integration times ranging from -30°C to 20°C under vacuum conditions around 10^-3 Pa while controlling count rate to about 20000 counts per frame to make sure that each pixel occupancy remained below 0.2%. Under each experimental condition dark exposures without X-ray illumination were taken first to obtain raw background images before conducting experiments with powered on X-ray tube where continuous raw images captured by sCMOS sensor were stored in image mode for data reduction purposes afterwards. The measurement method involved calculating an averaged background image from dark exposures under each experimental condition and processing X-ray exposure data frame by frame. For each frame (frame 0), preceding (frame m1) and two subsequent frames (frame 1 & 2) were examined after subtracting background image; residual charges were calculated for pixels exposed to X-rays in frames m1/0/1 or frames 0/1/2 respectively; difference between these residual charges was used then for calculation of image lag value which proved itself too small compared against readout noise level around 3e-.

• - Scientific CMOS (sCMOS) sensors have outperformed CCDs in higher readout frame rate, radiation tolerance, and working temperature.
• - Image lag can occur when charges of an event are not fully transferred inside pixels, degrading image quality for optical imaging and energy resolution for X-ray spectroscopy.
• - A new method was constructed to extract image lag from X-ray photons using a customized X-ray sCMOS sensor GSENSE1516BSI.
• - The image lag of this sensor exists only in the immediately subsequent frame and is always less than 0.05% for different incident photon energies and under different experimental conditions.
• - The residual charge was smaller than 0.5 e-, which is too small to have a significant impact on imaging quality or energy resolution compared to the readout noise level around 3 e-.
• - The image lag showed a positive correlation with incident photon energy and a negative correlation with temperature but had no dependence on gain setting or integration time.
• - Experiments were carried out with different gain settings and integration times ranging from -30°C to 20°C under vacuum conditions around 10^-3 Pa while controlling count rate to about 20000 counts per frame to make sure that each pixel occupancy remained below 0.2%.
• - The measurement method involved calculating an averaged background image from dark exposures under each experimental condition and processing X-ray exposure data frame by frame.

1. There are two types of sensors used in cameras: CCDs and sCMOS. 2. sCMOS sensors are better than CCDs in some ways, like being able to take pictures faster and working better in extreme conditions. 3. Sometimes when taking pictures, the image quality can be affected by something called "image lag," which happens when all the information from an event isn't transferred properly. 4. Scientists made a new way to measure image lag using a special type of sCMOS sensor called GSENSE1516BSI. 5. They found that this sensor has very little image lag and it doesn't affect picture quality or energy resolution. Definitions- Scientific CMOS (sCMOS): a type of camera sensor used for scientific purposes - CCDs: another type of camera sensor - Image lag: a problem that can happen when taking pictures where not all the information is transferred properly - X-ray spectroscopy: a technique used to study the properties of materials using X-rays - Photons: particles of light - Residual charge: leftover electrical charge after an event has occurred - Readout noise level: background noise in an image caused by the camera's electronics - Gain setting: how much amplification is applied to the signal from the camera sensor - Integration time: how long each pixel on the camera sensor collects light before transferring its information

Exploring Image Lag in X-Ray sCMOS Sensors

Scientific CMOS (sCMOS) sensors have been developed in recent years and are increasingly being used for optical imaging and X-ray spectroscopy due to their advantages over CCDs, such as higher readout frame rate, radiation tolerance, and working temperature. However, image lag can occur when the charges of an event are not fully transferred inside pixels, degrading image quality for optical imaging and energy resolution for X-ray spectroscopy. In order to better understand this phenomenon, a new method was constructed to extract image lag from X-ray photons using a customized X-ray sCMOS sensor GSENSE1516BSI.

Experimental Setup

To conduct experiments, an X-ray tube was operated under a current of 0.12 mA and high voltage of 30kV allowing close to 30 keV X-rays to be seen in the final spectrum. The quantum efficiency of the sensor at this high energy was low [25,26], capturing only a small number of incident photons by the sensor. Characteristic lines of Ti as well as Cr, Fe and Ni were found in the spectrum coming from stainless steel surrounding structures of the device. A series of experiments were carried out with different gain settings and integration times ranging from -30°C to 20°C under vacuum conditions around 10^-3 Pa while controlling count rate to about 20000 counts per frame so that each pixel occupancy remained below 0.2%. Under each experimental condition dark exposures without any illumination were taken first followed by powered on X-ray tube where continuous raw images captured by sCMOS sensor were stored in image mode for data reduction purposes afterwards.

Results

The results showed that the image lag existed only in immediately subsequent frames and was always less than 0.05% regardless of incident photon energies or experimental conditions tested here; residual charge was smaller than 0.5 e-, with highest incident photon charge around 8 ke-. Compared against readout noise level around 3 e-, it is clear that image lag had no significant impact on imaging quality or energy resolution since it is much smaller than readout noise level itself; however it did show positive correlation with incident photon energy as well as negative correlation with temperature but had no dependence on gain setting or integration time whatsoever which could be useful information when designing future experiments involving similar sensors/devices/conditions etc..

Conclusion

In conclusion, this study has demonstrated that image lag is too small compared against readout noise level around 3e-, thus having no significant impact on imaging quality or energy resolution when using GSENSE1516BSI sCMOS sensor under various experimental conditions tested here including different temperatures (-30°C - 20°C) , gain settings & integration times while controlling count rate at 20000 counts per frame so that each pixel occupancy remains below 0.2%. It also showed positive correlation between incident photon energy & image lag along with negative correlation between temperature & same parameter; however there seemed to be no dependence on gain setting nor integration time which should be taken into consideration during design phase for future experiments involving similar devices/conditions etc..